Tianyu Liu, Hao Luo, Kuan Li, Shen Yin, Baoran An. A Data-Driven Method for SKR Identification and Application to Stability Margin Estimation. In IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society, Washington, DC, USA, October 21-23, 2018. pages 6223-6228, IEEE, 2018. [doi]
Abstract is missing.