Reuse-based test access and integrated test scheduling for network-on-chip - researchr publication authors

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Chunsheng Liu, Zach Link, Dhiraj K. Pradhan. Reuse-based test access and integrated test scheduling for network-on-chip. In Georges G. E. Gielen, editor, Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006. pages 303-308, European Design and Automation Association, Leuven, Belgium, 2006. [doi]

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