Chunsheng Liu, Zach Link, Dhiraj K. Pradhan. Reuse-based test access and integrated test scheduling for network-on-chip. In Georges G. E. Gielen, editor, Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006. pages 303-308, European Design and Automation Association, Leuven, Belgium, 2006. [doi]
@inproceedings{LiuLP06,
title = {Reuse-based test access and integrated test scheduling for network-on-chip},
author = {Chunsheng Liu and Zach Link and Dhiraj K. Pradhan},
year = {2006},
doi = {10.1145/1131564},
url = {http://doi.acm.org/10.1145/1131564},
tags = {rule-based, testing, reuse},
researchr = {https://researchr.org/publication/LiuLP06},
cites = {0},
citedby = {0},
pages = {303-308},
booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006},
editor = {Georges G. E. Gielen},
publisher = {European Design and Automation Association, Leuven, Belgium},
isbn = {3-9810801-0-6},
}