A Novel Approach to Automate IoT Testing of Gateways and Devices

Chien-Hung Liu, Wen-Yew Liang, Ming-Yi Tsai, Wei-Che Chang, Woei-kae Chen. A Novel Approach to Automate IoT Testing of Gateways and Devices. J. Inf. Sci. Eng., 38(2):317-341, 2022. [doi]

Abstract

Abstract is missing.