Hsuan-Wei Liu, Bing-Yang Lin, Cheng-Wen Wu. Layout-Oriented Defect Set Reduction for Fast Circuit Simulation in Cell-Aware Test. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 156-160, IEEE Computer Society, 2016. [doi]
Abstract is missing.