3DET: Detecting System Symmetry Constraints for Analog Circuits with Graph Similarity

Mingjie Liu, Wuxi Li, Keren Zhu, Biying Xu, Yibo Lin, Linxiao Shen, Xiyuan Tang, Nan Sun, David Z. Pan. 3DET: Detecting System Symmetry Constraints for Analog Circuits with Graph Similarity. In 25th Asia and South Pacific Design Automation Conference, ASP-DAC 2020, Beijing, China, January 13-16, 2020. pages 193-198, IEEE, 2020. [doi]

@inproceedings{LiuLZXLSTSP20,
  title = {3DET: Detecting System Symmetry Constraints for Analog Circuits with Graph Similarity},
  author = {Mingjie Liu and Wuxi Li and Keren Zhu and Biying Xu and Yibo Lin and Linxiao Shen and Xiyuan Tang and Nan Sun and David Z. Pan},
  year = {2020},
  doi = {10.1109/ASP-DAC47756.2020.9045109},
  url = {https://doi.org/10.1109/ASP-DAC47756.2020.9045109},
  researchr = {https://researchr.org/publication/LiuLZXLSTSP20},
  cites = {0},
  citedby = {0},
  pages = {193-198},
  booktitle = {25th Asia and South Pacific Design Automation Conference, ASP-DAC 2020, Beijing, China, January 13-16, 2020},
  publisher = {IEEE},
  isbn = {978-1-7281-4123-7},
}