Use Machine Learning Based Smart Sampling to Improve System Level Testing Efficiency

Chenwei Liu, Jie Ou. Use Machine Learning Based Smart Sampling to Improve System Level Testing Efficiency. In IEEE International Test Conference in Asia, ITC-Asia 2021, Shanghai, China, August 18-20, 2021. pages 1-6, IEEE, 2021. [doi]

Authors

Chenwei Liu

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Jie Ou

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