Rui Liu, Soumya Ray. An Analysis of Boosted Linear Classifiers on Noisy Data with Applications to Multiple-Instance Learning. In Vijay Raghavan, Srinivas Aluru, George Karypis, Lucio Miele, Xindong Wu, editors, 2017 IEEE International Conference on Data Mining, ICDM 2017, New Orleans, LA, USA, November 18-21, 2017. pages 287-296, IEEE Computer Society, 2017. [doi]
@inproceedings{LiuR17-8,
title = {An Analysis of Boosted Linear Classifiers on Noisy Data with Applications to Multiple-Instance Learning},
author = {Rui Liu and Soumya Ray},
year = {2017},
doi = {10.1109/ICDM.2017.38},
url = {http://doi.ieeecomputersociety.org/10.1109/ICDM.2017.38},
researchr = {https://researchr.org/publication/LiuR17-8},
cites = {0},
citedby = {0},
pages = {287-296},
booktitle = {2017 IEEE International Conference on Data Mining, ICDM 2017, New Orleans, LA, USA, November 18-21, 2017},
editor = {Vijay Raghavan and Srinivas Aluru and George Karypis and Lucio Miele and Xindong Wu},
publisher = {IEEE Computer Society},
isbn = {978-1-5386-3835-4},
}