Exploring features in a Bayesian framework for material recognition - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Ce Liu, Lavanya Sharan, Edward H. Adelson, Ruth Rosenholtz. Exploring features in a Bayesian framework for material recognition. In The Twenty-Third IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2010, San Francisco, CA, USA, 13-18 June 2010. pages 239-246, IEEE, 2010. [doi]

This author has not been identified. Look up 'Ce Liu' in GoogleThis author has not been identified. Look up 'Lavanya Sharan' in GoogleThis author has not been identified. Look up 'Edward H. Adelson' in GoogleThis author has not been identified. Look up 'Ruth Rosenholtz' in Google

runs on WebDSL