Ce Liu, Lavanya Sharan, Edward H. Adelson, Ruth Rosenholtz. Exploring features in a Bayesian framework for material recognition. In The Twenty-Third IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2010, San Francisco, CA, USA, 13-18 June 2010. pages 239-246, IEEE, 2010. [doi]
@inproceedings{LiuSAR10,
title = {Exploring features in a Bayesian framework for material recognition},
author = {Ce Liu and Lavanya Sharan and Edward H. Adelson and Ruth Rosenholtz},
year = {2010},
doi = {10.1109/CVPR.2010.5540207},
url = {http://dx.doi.org/10.1109/CVPR.2010.5540207},
researchr = {https://researchr.org/publication/LiuSAR10},
cites = {0},
citedby = {0},
pages = {239-246},
booktitle = {The Twenty-Third IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2010, San Francisco, CA, USA, 13-18 June 2010},
publisher = {IEEE},
}