Characteristics analysis and optimization design of a new ESD power clamp circuit

Hongxia Liu, Baojun Tang, Yue Hao. Characteristics analysis and optimization design of a new ESD power clamp circuit. Microelectronics Reliability, 50(8):1087-1093, 2010. [doi]

Authors

Hongxia Liu

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Baojun Tang

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Yue Hao

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