Hongxia Liu, Baojun Tang, Yue Hao. Characteristics analysis and optimization design of a new ESD power clamp circuit. Microelectronics Reliability, 50(8):1087-1093, 2010. [doi]
@article{LiuTH10,
title = {Characteristics analysis and optimization design of a new ESD power clamp circuit},
author = {Hongxia Liu and Baojun Tang and Yue Hao},
year = {2010},
doi = {10.1016/j.microrel.2010.04.004},
url = {http://dx.doi.org/10.1016/j.microrel.2010.04.004},
tags = {optimization, analysis, design},
researchr = {https://researchr.org/publication/LiuTH10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {8},
pages = {1087-1093},
}