Kang Liu 0004, Benjamin Tan, Ramesh Karri, Siddharth Garg. Training Data Poisoning in ML-CAD: Backdooring DL-Based Lithographic Hotspot Detectors. IEEE Trans. on CAD of Integrated Circuits and Systems, 40(6):1244-1257, 2021. [doi]
@article{LiuTKG21, title = {Training Data Poisoning in ML-CAD: Backdooring DL-Based Lithographic Hotspot Detectors}, author = {Kang Liu 0004 and Benjamin Tan and Ramesh Karri and Siddharth Garg}, year = {2021}, doi = {10.1109/TCAD.2020.3024780}, url = {https://doi.org/10.1109/TCAD.2020.3024780}, researchr = {https://researchr.org/publication/LiuTKG21}, cites = {0}, citedby = {0}, journal = {IEEE Trans. on CAD of Integrated Circuits and Systems}, volume = {40}, number = {6}, pages = {1244-1257}, }