Kang Liu 0004, Benjamin Tan, Ramesh Karri, Siddharth Garg. Training Data Poisoning in ML-CAD: Backdooring DL-Based Lithographic Hotspot Detectors. IEEE Trans. on CAD of Integrated Circuits and Systems, 40(6):1244-1257, 2021. [doi]
@article{LiuTKG21,
title = {Training Data Poisoning in ML-CAD: Backdooring DL-Based Lithographic Hotspot Detectors},
author = {Kang Liu 0004 and Benjamin Tan and Ramesh Karri and Siddharth Garg},
year = {2021},
doi = {10.1109/TCAD.2020.3024780},
url = {https://doi.org/10.1109/TCAD.2020.3024780},
researchr = {https://researchr.org/publication/LiuTKG21},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {40},
number = {6},
pages = {1244-1257},
}