Bao Liu, Lu Wang. Input-aware statistical timing analysis-based delay test pattern generation. In International Symposium on Quality Electronic Design, ISQED 2013, Santa Clara, CA, USA, March 4-6, 2013. pages 454-459, IEEE, 2013. [doi]
@inproceedings{LiuW13-1,
title = {Input-aware statistical timing analysis-based delay test pattern generation},
author = {Bao Liu and Lu Wang},
year = {2013},
doi = {10.1109/ISQED.2013.6523651},
url = {http://dx.doi.org/10.1109/ISQED.2013.6523651},
researchr = {https://researchr.org/publication/LiuW13-1},
cites = {0},
citedby = {0},
pages = {454-459},
booktitle = {International Symposium on Quality Electronic Design, ISQED 2013, Santa Clara, CA, USA, March 4-6, 2013},
publisher = {IEEE},
isbn = {978-1-4673-4951-2},
}