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Characterization Summary of Performance, Reliability, and Threshold Voltage Distribution of 3D Charge-Trap NAND Flash Memory

Weihua Liu, Fei Wu 0005, Xiang Chen, Meng Zhang 0014, Yu Wang, Xiangfeng Lu, Changsheng Xie. Characterization Summary of Performance, Reliability, and Threshold Voltage Distribution of 3D Charge-Trap NAND Flash Memory. TOS, 18(2), 2022. [doi]

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