Fault detection and location of microgrid based on distributed decision

Penglei Liu, Yalian Wu, Yongxin Su, Bin Duan. Fault detection and location of microgrid based on distributed decision. In IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, October 29 - November 1, 2017. pages 5054-5059, IEEE, 2017. [doi]

Abstract

Abstract is missing.