Degradation behaviors of GaN light-emitting diodes under high-temperature and high-current stressing - researchr publication authors

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J. Liu, H. Wong, Sik-Lam Siu, Chi-Wah Kok, V. Filip. Degradation behaviors of GaN light-emitting diodes under high-temperature and high-current stressing. Microelectronics Reliability, 52(8):1636-1639, 2012. [doi]

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