J. Liu, H. Wong, Sik-Lam Siu, Chi-Wah Kok, V. Filip. Degradation behaviors of GaN light-emitting diodes under high-temperature and high-current stressing. Microelectronics Reliability, 52(8):1636-1639, 2012. [doi]
@article{LiuWSKF12,
title = {Degradation behaviors of GaN light-emitting diodes under high-temperature and high-current stressing},
author = {J. Liu and H. Wong and Sik-Lam Siu and Chi-Wah Kok and V. Filip},
year = {2012},
doi = {10.1016/j.microrel.2011.09.014},
url = {http://dx.doi.org/10.1016/j.microrel.2011.09.014},
researchr = {https://researchr.org/publication/LiuWSKF12},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {52},
number = {8},
pages = {1636-1639},
}