Enhancing Sensor Pattern Noise for Source Camera Identification: An Empirical Evaluation

Bei-Bei Liu, Xingjie Wei, Jeff Yan. Enhancing Sensor Pattern Noise for Source Camera Identification: An Empirical Evaluation. In Adnan M. Alattar, Jessica J. Fridrich, Ned M. Smith, Pedro ComesaƱa Alfaro, editors, Proceedings of the 3rd ACM Workshop on Information Hiding and Multimedia Security, IH&MMSec 2015, Portland, OR, USA, June 17 - 19, 2015. pages 85-90, ACM, 2015. [doi]

Abstract

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