Xiao Liu, Qiang Xu. A generic framework for scan capture power reduction in fixed-length symbol-based test compression environment. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009. pages 1494-1499, IEEE, 2009. [doi]
@inproceedings{LiuX09a,
title = {A generic framework for scan capture power reduction in fixed-length symbol-based test compression environment},
author = {Xiao Liu and Qiang Xu},
year = {2009},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5090609&arnumber=5090899&count=326&index=285},
tags = {meta-model, testing, Meta-Environment, meta-objects},
researchr = {https://researchr.org/publication/LiuX09a},
cites = {0},
citedby = {0},
pages = {1494-1499},
booktitle = {Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009},
publisher = {IEEE},
}