Xiao Liu, Qiang Xu. On efficient silicon debug with flexible trace interconnection fabric. In 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012. pages 1-9, IEEE Computer Society, 2012. [doi]
@inproceedings{LiuX12,
title = {On efficient silicon debug with flexible trace interconnection fabric},
author = {Xiao Liu and Qiang Xu},
year = {2012},
doi = {10.1109/TEST.2012.6401539},
url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2012.6401539},
researchr = {https://researchr.org/publication/LiuX12},
cites = {0},
citedby = {0},
pages = {1-9},
booktitle = {2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-1594-4},
}