Compressive Classification Based on One-Bit Measurements

Qihang Liu, Wenbo Xu, Yifei Dang, Xiaolin Wang. Compressive Classification Based on One-Bit Measurements. In 2019 IEEE/CIC International Conference on Communications in China, ICCC 2019, Changchun, China, August 11-13, 2019. pages 101-105, IEEE, 2019. [doi]

Abstract

Abstract is missing.