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FLUX: Finding Bugs with LLVM IR Based Unit Test Crossovers

Eric Liu, Shengjie Xu, David Lie. FLUX: Finding Bugs with LLVM IR Based Unit Test Crossovers. In 38th IEEE/ACM International Conference on Automated Software Engineering, ASE 2023, Luxembourg, September 11-15, 2023. pages 1061-1072, IEEE, 2023. [doi]

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Eric Liu

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Shengjie Xu

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David Lie

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