Eric Liu, Shengjie Xu, David Lie. FLUX: Finding Bugs with LLVM IR Based Unit Test Crossovers. In 38th IEEE/ACM International Conference on Automated Software Engineering, ASE 2023, Luxembourg, September 11-15, 2023. pages 1061-1072, IEEE, 2023. [doi]
@inproceedings{LiuXL23-7,
title = {FLUX: Finding Bugs with LLVM IR Based Unit Test Crossovers},
author = {Eric Liu and Shengjie Xu and David Lie},
year = {2023},
doi = {10.1109/ASE56229.2023.00100},
url = {https://doi.org/10.1109/ASE56229.2023.00100},
researchr = {https://researchr.org/publication/LiuXL23-7},
cites = {0},
citedby = {0},
pages = {1061-1072},
booktitle = {38th IEEE/ACM International Conference on Automated Software Engineering, ASE 2023, Luxembourg, September 11-15, 2023},
publisher = {IEEE},
isbn = {979-8-3503-2996-4},
}