Open-Circuit Fault Diagnosis for MMC Based on Event-Triggered and Capacitor Current State Observation

Zehao Liu, Lan Xiao, Qin Wang, Jinbo Li, Qunfang Wu. Open-Circuit Fault Diagnosis for MMC Based on Event-Triggered and Capacitor Current State Observation. IEEE Trans. Circuits Syst. II Express Briefs, 69(2):534-538, 2022. [doi]

Abstract

Abstract is missing.