Ziqiang Liu, Kejiang Ye. YOLO-IMF: An Improved YOLOv8 Algorithm for Surface Defect Detection in Industrial Manufacturing Field. In Sheng He, Jiacai Lai, Liang-Jie Zhang, editors, Metaverse - METAVERSE 2023 - 19th International Conference, Held as Part of the Services Conference Federation, SCF 2023, Honolulu, HI, USA, September 23-26, 2023, Proceedings. Volume 14210 of Lecture Notes in Computer Science, pages 15-28, Springer, 2023. [doi]
Abstract is missing.