Reliability modeling for dependent competing failure processes with damage self-recovery phenomenon - researchr publication authors

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Hanlin Liu, Ruey Huei Yeh, Baoping Cai. Reliability modeling for dependent competing failure processes with damage self-recovery phenomenon. In 2015 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2015, Singapore, December 6-9, 2015. pages 756-760, IEEE, 2015. [doi]

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