Hanlin Liu, Ruey Huei Yeh, Baoping Cai. Reliability modeling for dependent competing failure processes with damage self-recovery phenomenon. In 2015 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2015, Singapore, December 6-9, 2015. pages 756-760, IEEE, 2015. [doi]
@inproceedings{LiuYC15-2,
title = {Reliability modeling for dependent competing failure processes with damage self-recovery phenomenon},
author = {Hanlin Liu and Ruey Huei Yeh and Baoping Cai},
year = {2015},
doi = {10.1109/IEEM.2015.7385749},
url = {http://dx.doi.org/10.1109/IEEM.2015.7385749},
researchr = {https://researchr.org/publication/LiuYC15-2},
cites = {0},
citedby = {0},
pages = {756-760},
booktitle = {2015 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2015, Singapore, December 6-9, 2015},
publisher = {IEEE},
isbn = {978-1-4673-8066-9},
}