Baojun Liu, Xiaokuo Yang, Jing Zhu. Variations of single event transient induced by line edge roughness (LER) and temperature in FinFET. Microelectronics Journal, 144:106063, February 2024. [doi]
@article{LiuYZ24-1,
title = {Variations of single event transient induced by line edge roughness (LER) and temperature in FinFET},
author = {Baojun Liu and Xiaokuo Yang and Jing Zhu},
year = {2024},
month = {February},
doi = {10.1016/j.mejo.2023.106063},
url = {https://doi.org/10.1016/j.mejo.2023.106063},
researchr = {https://researchr.org/publication/LiuYZ24-1},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {144},
pages = {106063},
}