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The effect of external stress on the electrical characteristics of AlGaN/GaN HEMTs

Kun Liu, Hui Zhu, Shiwei Feng, Lei Shi, Yamin Zhang, Chunsheng Guo. The effect of external stress on the electrical characteristics of AlGaN/GaN HEMTs. Microelectronics Reliability, 55(6):886-889, 2015. [doi]

Authors

Kun Liu

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Hui Zhu

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Shiwei Feng

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Lei Shi

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Yamin Zhang

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Chunsheng Guo

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