Kun Liu, Hui Zhu, Shiwei Feng, Lei Shi, Yamin Zhang, Chunsheng Guo. The effect of external stress on the electrical characteristics of AlGaN/GaN HEMTs. Microelectronics Reliability, 55(6):886-889, 2015. [doi]
@article{LiuZFSZG15,
title = {The effect of external stress on the electrical characteristics of AlGaN/GaN HEMTs},
author = {Kun Liu and Hui Zhu and Shiwei Feng and Lei Shi and Yamin Zhang and Chunsheng Guo},
year = {2015},
doi = {10.1016/j.microrel.2015.03.012},
url = {http://dx.doi.org/10.1016/j.microrel.2015.03.012},
researchr = {https://researchr.org/publication/LiuZFSZG15},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {55},
number = {6},
pages = {886-889},
}