Chenxi Liu, YaXing Zhou, Pingyang Huang, Shikun He, Zhiyuan Cheng. Dynamic Step-Size Single-Write Pattern Trimming for STT-MRAM Reference Resistance Optimization. In 34th IEEE Asian Test Symposium, ATS 2025, Tokyo, Japan, December 16-19, 2025. pages 127-132, IEEE, 2025. [doi]
Abstract is missing.