Tieqiao Liu, Yingbo Zhou, Yi Liu, Shuo Cai. Harzard-Based ATPG for Improving Delay Test Quality. J. Electronic Testing, 31(1):27-34, 2015. [doi]
@article{LiuZLC15,
title = {Harzard-Based ATPG for Improving Delay Test Quality},
author = {Tieqiao Liu and Yingbo Zhou and Yi Liu and Shuo Cai},
year = {2015},
doi = {10.1007/s10836-014-5503-3},
url = {http://dx.doi.org/10.1007/s10836-014-5503-3},
researchr = {https://researchr.org/publication/LiuZLC15},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {31},
number = {1},
pages = {27-34},
}