Class-wise Metric Scaling for Improved Few-Shot Classification

Ge Liu, Linglan Zhao, Wei Li 0084, Dashan Guo, Xiangzhong Fang. Class-wise Metric Scaling for Improved Few-Shot Classification. In IEEE Winter Conference on Applications of Computer Vision, WACV 2021, Waikoloa, HI, USA, January 3-8, 2021. pages 586-595, IEEE, 2021. [doi]

@inproceedings{LiuZLGF21,
  title = {Class-wise Metric Scaling for Improved Few-Shot Classification},
  author = {Ge Liu and Linglan Zhao and Wei Li 0084 and Dashan Guo and Xiangzhong Fang},
  year = {2021},
  doi = {10.1109/WACV48630.2021.00063},
  url = {https://doi.org/10.1109/WACV48630.2021.00063},
  researchr = {https://researchr.org/publication/LiuZLGF21},
  cites = {0},
  citedby = {0},
  pages = {586-595},
  booktitle = {IEEE Winter Conference on Applications of Computer Vision, WACV 2021, Waikoloa, HI, USA, January 3-8, 2021},
  publisher = {IEEE},
  isbn = {978-1-6654-0477-8},
}