Class-wise Metric Scaling for Improved Few-Shot Classification

Ge Liu, Linglan Zhao, Wei Li 0084, Dashan Guo, Xiangzhong Fang. Class-wise Metric Scaling for Improved Few-Shot Classification. In IEEE Winter Conference on Applications of Computer Vision, WACV 2021, Waikoloa, HI, USA, January 3-8, 2021. pages 586-595, IEEE, 2021. [doi]

Abstract

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