Defect detection network for micro-electrical connectors based on dual-branch feature extraction and dynamic bias with granularity enhancement encoder - researchr publication

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Qunpo Liu, Jiawen Zhao, Hongqi Wang, Naohiko Hanajima, Xuhui Bu. Defect detection network for micro-electrical connectors based on dual-branch feature extraction and dynamic bias with granularity enhancement encoder. Eng. Appl. of AI, 165:113468, 2026. [doi]

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