Markov process based reliability model for laser diodes in space radiation environment

Yun Liu, Shanghong Zhao, Shengsheng Yang, Yongjun Li, Ruoxin Qiang. Markov process based reliability model for laser diodes in space radiation environment. Microelectronics Reliability, 54(12):2735-2739, 2014. [doi]

Authors

Yun Liu

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Shanghong Zhao

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Shengsheng Yang

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Yongjun Li

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Ruoxin Qiang

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