Yun Liu, Shanghong Zhao, Shengsheng Yang, Yongjun Li, Ruoxin Qiang. Markov process based reliability model for laser diodes in space radiation environment. Microelectronics Reliability, 54(12):2735-2739, 2014. [doi]
@article{LiuZYLQ14,
title = {Markov process based reliability model for laser diodes in space radiation environment},
author = {Yun Liu and Shanghong Zhao and Shengsheng Yang and Yongjun Li and Ruoxin Qiang},
year = {2014},
doi = {10.1016/j.microrel.2014.08.006},
url = {http://dx.doi.org/10.1016/j.microrel.2014.08.006},
researchr = {https://researchr.org/publication/LiuZYLQ14},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {54},
number = {12},
pages = {2735-2739},
}