Changsong Liu, Yangyang Zhao, Yibiao Yang, Hongmin Lu, Yuming Zhou, Baowen Xu. An AST-Based Approach to Classifying Defects. In 2015 IEEE International Conference on Software Quality, Reliability and Security, QRS 2015, Companion, Vancouver, BC, Canada, August 3-5, 2015. pages 14-21, IEEE, 2015. [doi]
@inproceedings{LiuZYLZX15,
title = {An AST-Based Approach to Classifying Defects},
author = {Changsong Liu and Yangyang Zhao and Yibiao Yang and Hongmin Lu and Yuming Zhou and Baowen Xu},
year = {2015},
doi = {10.1109/QRS-C.2015.15},
url = {http://dx.doi.org/10.1109/QRS-C.2015.15},
researchr = {https://researchr.org/publication/LiuZYLZX15},
cites = {0},
citedby = {0},
pages = {14-21},
booktitle = {2015 IEEE International Conference on Software Quality, Reliability and Security, QRS 2015, Companion, Vancouver, BC, Canada, August 3-5, 2015},
publisher = {IEEE},
isbn = {978-1-4673-9598-4},
}