Changsong Liu, Yangyang Zhao, Yibiao Yang, Hongmin Lu, Yuming Zhou, Baowen Xu. An AST-Based Approach to Classifying Defects. In 2015 IEEE International Conference on Software Quality, Reliability and Security, QRS 2015, Companion, Vancouver, BC, Canada, August 3-5, 2015. pages 14-21, IEEE, 2015. [doi]
Abstract is missing.