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A Multi-Subband Monte Carlo study of electron transport in strained SiGe n-type FinFETs

Daniel Lizzit, Pierpaolo Palestri, David Esseni, Francesco Conzatti, Luca Selmi. A Multi-Subband Monte Carlo study of electron transport in strained SiGe n-type FinFETs. In Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012. pages 322-325, IEEE, 2012. [doi]

Authors

Daniel Lizzit

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Pierpaolo Palestri

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David Esseni

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Francesco Conzatti

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Luca Selmi

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