Daniel Lizzit, Pierpaolo Palestri, David Esseni, Francesco Conzatti, Luca Selmi. A Multi-Subband Monte Carlo study of electron transport in strained SiGe n-type FinFETs. In Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012. pages 322-325, IEEE, 2012. [doi]
Abstract is missing.