Shih-Ching Lo, Jyun-Hwei Tsai, Jer-Ming Hsu, Yiming Li. Quantum Mechanical Gate Current Simulation in MOSFETs with Ultrathin Oxides. In Hamid R. Arabnia, Laurence Tianruo Yang, editors, Proceedings of the International Conference on VLSI, VLSI 03, June 23 - 26, 2003, Las Vegas, Nevada, USA. pages 244-250, CSREA Press, 2003.
@inproceedings{LoTHL03,
title = {Quantum Mechanical Gate Current Simulation in MOSFETs with Ultrathin Oxides},
author = {Shih-Ching Lo and Jyun-Hwei Tsai and Jer-Ming Hsu and Yiming Li},
year = {2003},
researchr = {https://researchr.org/publication/LoTHL03},
cites = {0},
citedby = {0},
pages = {244-250},
booktitle = {Proceedings of the International Conference on VLSI, VLSI 03, June 23 - 26, 2003, Las Vegas, Nevada, USA},
editor = {Hamid R. Arabnia and Laurence Tianruo Yang},
publisher = {CSREA Press},
isbn = {1-932415-10-6},
}