Leon van de Logt, Frank van der Heyden, Tom Waayers. An extension to JTAG for at-speed debug on a system. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 785-792, IEEE Computer Society, 2003. [doi]
Abstract is missing.