Fast simulation based testing of anti-tearing mechanisms for small embedded systems

Johannes Loinig, Christian Steger, Reinhold Weiss, Ernst Haselsteiner. Fast simulation based testing of anti-tearing mechanisms for small embedded systems. In 15th European Test Symposium (ETS 2010), May 24-28, 2010, Prague, Czech Republic. pages 242, IEEE Computer Society, 2010. [doi]

Authors

Johannes Loinig

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Christian Steger

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Reinhold Weiss

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Ernst Haselsteiner

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