Fast simulation based testing of anti-tearing mechanisms for small embedded systems

Johannes Loinig, Christian Steger, Reinhold Weiss, Ernst Haselsteiner. Fast simulation based testing of anti-tearing mechanisms for small embedded systems. In 15th European Test Symposium (ETS 2010), May 24-28, 2010, Prague, Czech Republic. pages 242, IEEE Computer Society, 2010. [doi]

@inproceedings{LoinigSWH10,
  title = {Fast simulation based testing of anti-tearing mechanisms for small embedded systems},
  author = {Johannes Loinig and Christian Steger and Reinhold Weiss and Ernst Haselsteiner},
  year = {2010},
  doi = {10.1109/ETSYM.2010.5512751},
  url = {http://dx.doi.org/10.1109/ETSYM.2010.5512751},
  tags = {rule-based, testing},
  researchr = {https://researchr.org/publication/LoinigSWH10},
  cites = {0},
  citedby = {0},
  pages = {242},
  booktitle = {15th European Test Symposium (ETS 2010), May 24-28, 2010, Prague, Czech Republic},
  publisher = {IEEE Computer Society},
  isbn = {978-1-4244-5833-2},
}