Thomas Loise, Xavier Devroey, Gilles Perrouin, Mike Papadakis, Patrick Heymans. Towards Security-Aware Mutation Testing. In 2017 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICST Workshops 2017, Tokyo, Japan, March 13-17, 2017. pages 97-102, IEEE Computer Society, 2017. [doi]
Abstract is missing.