Jaime Lomeli-Rodriguez, Mark S. Nixon. Learning Salient Structures for the Analysis of Symmetric Patterns. In Fakhri Karray, Aurélio Campilho, Farida Cheriet, editors, Image Analysis and Recognition - 14th International Conference, ICIAR 2017, Montreal, QC, Canada, July 5-7, 2017, Proceedings. Volume 10317 of Lecture Notes in Computer Science, pages 286-295, Springer, 2017. [doi]
Abstract is missing.