Francesco Lomio, Luca Pascarella, Fabio Palomba, Valentina Lenarduzzi. Regularity or Anomaly? On The Use of Anomaly Detection for Fine-Grained JIT Defect Prediction. In Gustavo Marrero Callico, Regina Hebig, Andreas Wortmann 0001, editors, 48th Euromicro Conference on Software Engineering and Advanced Applications, SEAA 2022, Maspalomas, Gran Canaria, Spain, 31 August - 2 September 2022. pages 270-273, IEEE, 2022. [doi]
Abstract is missing.