Sabine Long, Laurent Escotte, Jacques Graffeuil, F. Brasseau, J. L. Cazaux. On-wafer noise characterization of low-noise amplifiers in the Ka-band. IEEE T. Instrumentation and Measurement, 52(5):1606-1610, 2003. [doi]
@article{LongEGBC03,
title = {On-wafer noise characterization of low-noise amplifiers in the Ka-band},
author = {Sabine Long and Laurent Escotte and Jacques Graffeuil and F. Brasseau and J. L. Cazaux},
year = {2003},
doi = {10.1109/TIM.2003.817156},
url = {http://dx.doi.org/10.1109/TIM.2003.817156},
researchr = {https://researchr.org/publication/LongEGBC03},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {52},
number = {5},
pages = {1606-1610},
}